OURSTEX

Fruit of Element Technology/ High Sensitivity, High Accuracy

Energy Dispersive X-ray Fluorescence Spectrometer makes qualitative and quantitative nondestructive element analysis possible regardless of sample form by measuring fluorescent X-rays which are generated by irradiation of primary X-ray from X-ray tube to a sample through a semiconductor detector.

The semiconductor detector uses silicon drift detector (SDD) with electron cooling system which does not require liquid nitrogen cooling, and then makes high resolution and high counting rate measurement possible by combining with our original digital scaling circuit processor (DSP).

To make an analytical performance higher, an excitation optical system is set with the best condition to get the highest performance of energy resolution and counting sensitivity of the semiconductor detector.

OURSTEX 100FA performs the following measurements with high sensitivity!

For light element measurement, direct irradiation with low voltage eliminates interference by heavy element spectrum, and a Pd-L line is effectively used.

For medium and heavy element measurement, monochoromating a primary X-ray by monochromator and exciting it by K-line of tube target inhibits background noise.